A feature-based approach for processing nanoscale images

Gregory Roughton, Aparna Varde, Stefan Robila, Jianyu Liang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

Nanotechnology is a rapidly emerging field in which the material structures are of the size 100 nanometers or smaller. Thus, analyzing images at the nanoscale level is a challenging task. Users in this field are interested in image analysis and processing to draw conclusions such as the impact of various experimental conditions on the nature of the image and consequently their usefulness in several applications. This motivates our work that involves designing a system that will not only recognize similarities and differences among images, but do so efficiently and accurately. Features are representative of the manner in which images are compared by human experts by finding empirical data about particle sizes, material depth, inter-particle distances and so forth. In this work, we look into the use of features for comparison by implementing a feature-based algorithm on real image data sets from nanotechnology and thereafter using the results in processes such as clustering that are commonly applied by users to analyze images. We are able to effectively assess the feature-based approach in a real-world context as corroborated by our experimental evaluation.

Original languageEnglish
Title of host publicationScanning Microscopy 2010
Volume7729
DOIs
StatePublished - 16 Jul 2010
EventScanning Microscopy 2010 - Monterey, CA, United States
Duration: 17 May 201019 May 2010

Other

OtherScanning Microscopy 2010
CountryUnited States
CityMonterey, CA
Period17/05/1019/05/10

Fingerprint

Nanotechnology
image processing
Image processing
Image analysis
Particle size
nanotechnology
image analysis
Particle Size
Experimental Evaluation
Image Analysis
emerging
Image Processing
Clustering
evaluation

Cite this

Roughton, G., Varde, A., Robila, S., & Liang, J. (2010). A feature-based approach for processing nanoscale images. In Scanning Microscopy 2010 (Vol. 7729). [772911] https://doi.org/10.1117/12.853412
Roughton, Gregory ; Varde, Aparna ; Robila, Stefan ; Liang, Jianyu. / A feature-based approach for processing nanoscale images. Scanning Microscopy 2010. Vol. 7729 2010.
@inproceedings{4cc69a27a6cd4f8d98487df73c70c471,
title = "A feature-based approach for processing nanoscale images",
abstract = "Nanotechnology is a rapidly emerging field in which the material structures are of the size 100 nanometers or smaller. Thus, analyzing images at the nanoscale level is a challenging task. Users in this field are interested in image analysis and processing to draw conclusions such as the impact of various experimental conditions on the nature of the image and consequently their usefulness in several applications. This motivates our work that involves designing a system that will not only recognize similarities and differences among images, but do so efficiently and accurately. Features are representative of the manner in which images are compared by human experts by finding empirical data about particle sizes, material depth, inter-particle distances and so forth. In this work, we look into the use of features for comparison by implementing a feature-based algorithm on real image data sets from nanotechnology and thereafter using the results in processes such as clustering that are commonly applied by users to analyze images. We are able to effectively assess the feature-based approach in a real-world context as corroborated by our experimental evaluation.",
author = "Gregory Roughton and Aparna Varde and Stefan Robila and Jianyu Liang",
year = "2010",
month = "7",
day = "16",
doi = "10.1117/12.853412",
language = "English",
isbn = "9780819482174",
volume = "7729",
booktitle = "Scanning Microscopy 2010",

}

Roughton, G, Varde, A, Robila, S & Liang, J 2010, A feature-based approach for processing nanoscale images. in Scanning Microscopy 2010. vol. 7729, 772911, Scanning Microscopy 2010, Monterey, CA, United States, 17/05/10. https://doi.org/10.1117/12.853412

A feature-based approach for processing nanoscale images. / Roughton, Gregory; Varde, Aparna; Robila, Stefan; Liang, Jianyu.

Scanning Microscopy 2010. Vol. 7729 2010. 772911.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

TY - GEN

T1 - A feature-based approach for processing nanoscale images

AU - Roughton, Gregory

AU - Varde, Aparna

AU - Robila, Stefan

AU - Liang, Jianyu

PY - 2010/7/16

Y1 - 2010/7/16

N2 - Nanotechnology is a rapidly emerging field in which the material structures are of the size 100 nanometers or smaller. Thus, analyzing images at the nanoscale level is a challenging task. Users in this field are interested in image analysis and processing to draw conclusions such as the impact of various experimental conditions on the nature of the image and consequently their usefulness in several applications. This motivates our work that involves designing a system that will not only recognize similarities and differences among images, but do so efficiently and accurately. Features are representative of the manner in which images are compared by human experts by finding empirical data about particle sizes, material depth, inter-particle distances and so forth. In this work, we look into the use of features for comparison by implementing a feature-based algorithm on real image data sets from nanotechnology and thereafter using the results in processes such as clustering that are commonly applied by users to analyze images. We are able to effectively assess the feature-based approach in a real-world context as corroborated by our experimental evaluation.

AB - Nanotechnology is a rapidly emerging field in which the material structures are of the size 100 nanometers or smaller. Thus, analyzing images at the nanoscale level is a challenging task. Users in this field are interested in image analysis and processing to draw conclusions such as the impact of various experimental conditions on the nature of the image and consequently their usefulness in several applications. This motivates our work that involves designing a system that will not only recognize similarities and differences among images, but do so efficiently and accurately. Features are representative of the manner in which images are compared by human experts by finding empirical data about particle sizes, material depth, inter-particle distances and so forth. In this work, we look into the use of features for comparison by implementing a feature-based algorithm on real image data sets from nanotechnology and thereafter using the results in processes such as clustering that are commonly applied by users to analyze images. We are able to effectively assess the feature-based approach in a real-world context as corroborated by our experimental evaluation.

UR - http://www.scopus.com/inward/record.url?scp=77954484557&partnerID=8YFLogxK

U2 - 10.1117/12.853412

DO - 10.1117/12.853412

M3 - Conference contribution

AN - SCOPUS:77954484557

SN - 9780819482174

VL - 7729

BT - Scanning Microscopy 2010

ER -

Roughton G, Varde A, Robila S, Liang J. A feature-based approach for processing nanoscale images. In Scanning Microscopy 2010. Vol. 7729. 2010. 772911 https://doi.org/10.1117/12.853412