TY - JOUR
T1 - Computerized Adaptive Testing with Multiple-Form Structures
AU - Armstrong, Ronald D.
AU - Jones, Douglas H.
AU - Koppel, Nicole B.
AU - Pashley, Peter J.
PY - 2004/5
Y1 - 2004/5
N2 - A multiple-form structure (MFS) is an ordered collection or network of testlets (i.e., sets of items). An examinee's progression through the network of testlets is dictated by the correctness of an examinee's answers, thereby adapting the test to his or her trait level. The collection of paths through the network yields the set of all possible test forms, allowing test specialists the opportunity to review them before they are administered. Also, limiting the exposure of an individual MFS to a specific period of time can enhance test security. This article provides an overview of methods that have been developed to generate parallel MFSs. The approach is applied to the assembly of an experimental computerized Law School Admission Test (LSAT).
AB - A multiple-form structure (MFS) is an ordered collection or network of testlets (i.e., sets of items). An examinee's progression through the network of testlets is dictated by the correctness of an examinee's answers, thereby adapting the test to his or her trait level. The collection of paths through the network yields the set of all possible test forms, allowing test specialists the opportunity to review them before they are administered. Also, limiting the exposure of an individual MFS to a specific period of time can enhance test security. This article provides an overview of methods that have been developed to generate parallel MFSs. The approach is applied to the assembly of an experimental computerized Law School Admission Test (LSAT).
KW - Automated test assembly
KW - Computerized adaptive testing
KW - Item response theory
KW - Multiple-form structures
UR - http://www.scopus.com/inward/record.url?scp=2442597992&partnerID=8YFLogxK
U2 - 10.1177/0146621604263652
DO - 10.1177/0146621604263652
M3 - Review article
AN - SCOPUS:2442597992
SN - 0146-6216
VL - 28
SP - 147
EP - 164
JO - Applied Psychological Measurement
JF - Applied Psychological Measurement
IS - 3
ER -