Early science commissioning results of the sub-micron resolution X-ray spectroscopy beamline (SRX) in the field of materials science and engineering

Yu Chen Karen Chen-Wiegart, Garth Williams, Chonghang Zhao, Hua Jiang, Li Li, Michael Demkowicz, Matteo Seita, Mike Short, Sara Ferry, Takeshi Wada, Hidemi Kato, Kang Wei Chou, Stanislas Petrash, Jaclyn Catalano, Yao Yao, Anna Murphy, Nicholas Zumbulyadis, Silvia A. Centeno, Cecil Dybowski, Juergen Thieme

Research output: Chapter in Book/Report/Conference proceedingConference contribution

8 Scopus citations

Abstract

Beamline commissioning activities at the Sub-micron Resolution Spectroscopy Beamline, SRX, one of the project beamlines of the National Synchrotron Light Source II, began in December 2014. SRX is a hard x-ray micro-probe beamline. The technical capabilities presented in this paper include scanning micro-fluorescence microscopy (μ-XRF) and x-ray absorption near-edge structure (μ-XANES) spectroscopy. The high flux KBs station with sub-micron resolution in the step-scanning mode has been commissioned with results presented in this paper. Capabilities under commissioning/planning include XRF-XANES stack imaging, a high resolution station (sub-100 nm), x-ray fluorescence tomography, integration of Maia detector, and fly-scan mode. Early science commissioning results from SRX in the materials science field are presented in this paper. Topics being studied include nanoporous materials for energy conversion/storage, thin film materials for electronics, degradation of paint materials for art conservation, and grain boundary segregation in structural materials. On December 7th 2015, SRX officially became a user-operational beamline and started accepting general users. The users of interest are encouraged to contact the beamline staff and submit General User Proposals.

Original languageEnglish
Title of host publicationICXOM23
Subtitle of host publicationInternational Conference on X-Ray Optics and Microanalysis
EditorsJuergen Thieme, D. Peter Siddons
PublisherAmerican Institute of Physics Inc.
ISBN (Electronic)9780735414228
DOIs
StatePublished - 30 Aug 2016
Event23rd International Conference on X-Ray Optics and Microanalysis, ICXOM 2015 - Upton, United States
Duration: 14 Sep 201518 Sep 2015

Publication series

NameAIP Conference Proceedings
Volume1764
ISSN (Print)0094-243X
ISSN (Electronic)1551-7616

Other

Other23rd International Conference on X-Ray Optics and Microanalysis, ICXOM 2015
CountryUnited States
CityUpton
Period14/09/1518/09/15

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    Chen-Wiegart, Y. C. K., Williams, G., Zhao, C., Jiang, H., Li, L., Demkowicz, M., Seita, M., Short, M., Ferry, S., Wada, T., Kato, H., Chou, K. W., Petrash, S., Catalano, J., Yao, Y., Murphy, A., Zumbulyadis, N., Centeno, S. A., Dybowski, C., & Thieme, J. (2016). Early science commissioning results of the sub-micron resolution X-ray spectroscopy beamline (SRX) in the field of materials science and engineering. In J. Thieme, & D. P. Siddons (Eds.), ICXOM23: International Conference on X-Ray Optics and Microanalysis [030004] (AIP Conference Proceedings; Vol. 1764). American Institute of Physics Inc.. https://doi.org/10.1063/1.4961138