TY - GEN
T1 - Early science commissioning results of the sub-micron resolution X-ray spectroscopy beamline (SRX) in the field of materials science and engineering
AU - Chen-Wiegart, Yu Chen Karen
AU - Williams, Garth
AU - Zhao, Chonghang
AU - Jiang, Hua
AU - Li, Li
AU - Demkowicz, Michael
AU - Seita, Matteo
AU - Short, Mike
AU - Ferry, Sara
AU - Wada, Takeshi
AU - Kato, Hidemi
AU - Chou, Kang Wei
AU - Petrash, Stanislas
AU - Catalano, Jaclyn
AU - Yao, Yao
AU - Murphy, Anna
AU - Zumbulyadis, Nicholas
AU - Centeno, Silvia A.
AU - Dybowski, Cecil
AU - Thieme, Juergen
N1 - Publisher Copyright:
© 2016 Author(s).
PY - 2016/8/30
Y1 - 2016/8/30
N2 - Beamline commissioning activities at the Sub-micron Resolution Spectroscopy Beamline, SRX, one of the project beamlines of the National Synchrotron Light Source II, began in December 2014. SRX is a hard x-ray micro-probe beamline. The technical capabilities presented in this paper include scanning micro-fluorescence microscopy (μ-XRF) and x-ray absorption near-edge structure (μ-XANES) spectroscopy. The high flux KBs station with sub-micron resolution in the step-scanning mode has been commissioned with results presented in this paper. Capabilities under commissioning/planning include XRF-XANES stack imaging, a high resolution station (sub-100 nm), x-ray fluorescence tomography, integration of Maia detector, and fly-scan mode. Early science commissioning results from SRX in the materials science field are presented in this paper. Topics being studied include nanoporous materials for energy conversion/storage, thin film materials for electronics, degradation of paint materials for art conservation, and grain boundary segregation in structural materials. On December 7th 2015, SRX officially became a user-operational beamline and started accepting general users. The users of interest are encouraged to contact the beamline staff and submit General User Proposals.
AB - Beamline commissioning activities at the Sub-micron Resolution Spectroscopy Beamline, SRX, one of the project beamlines of the National Synchrotron Light Source II, began in December 2014. SRX is a hard x-ray micro-probe beamline. The technical capabilities presented in this paper include scanning micro-fluorescence microscopy (μ-XRF) and x-ray absorption near-edge structure (μ-XANES) spectroscopy. The high flux KBs station with sub-micron resolution in the step-scanning mode has been commissioned with results presented in this paper. Capabilities under commissioning/planning include XRF-XANES stack imaging, a high resolution station (sub-100 nm), x-ray fluorescence tomography, integration of Maia detector, and fly-scan mode. Early science commissioning results from SRX in the materials science field are presented in this paper. Topics being studied include nanoporous materials for energy conversion/storage, thin film materials for electronics, degradation of paint materials for art conservation, and grain boundary segregation in structural materials. On December 7th 2015, SRX officially became a user-operational beamline and started accepting general users. The users of interest are encouraged to contact the beamline staff and submit General User Proposals.
UR - http://www.scopus.com/inward/record.url?scp=85006154100&partnerID=8YFLogxK
U2 - 10.1063/1.4961138
DO - 10.1063/1.4961138
M3 - Conference contribution
AN - SCOPUS:85006154100
T3 - AIP Conference Proceedings
BT - ICXOM23
A2 - Thieme, Juergen
A2 - Siddons, D. Peter
PB - American Institute of Physics Inc.
T2 - 23rd International Conference on X-Ray Optics and Microanalysis, ICXOM 2015
Y2 - 14 September 2015 through 18 September 2015
ER -