Grain-Scale characterization of metals in New York/New Jersey harbor sediment

Jínos Osín, Szabina Török, Colin M. MacRae, Wooyong Um, Valeriy Titarenko, Huan Feng, Keith W. Jones

Research output: Chapter in Book/Report/Conference proceedingChapterpeer-review


Characterization of metals in sediments from the New York/New Jersey Harbor is necessary as part of the basic information needed in work related to dredging and environmental effects and restoration efforts in the region. In response to this need, the National Institute of Standards and Technology (NIST) created Standard Reference Material (SRM 1944, New York/New Jersey Waterway Sediment). This reference material gives values for selected metals and chemical compounds on a bulk scale. In this experiment, analyses were made on grains from the SRM and on a smaller -sized grain fraction from the original material used in preparing the SRM that was not included in the SRM. We used scanning electron microscope/back-scattered electron detector (SEM/BSE), scanning electron microscopy/energy dispersive X-ray spectroscopy (SEM/EDS), X-ray diffraction (XRD) and synchrotron computed microtomography (CMT) techniques to obtain metal concentration data on individual grains in these materials.

Original languageEnglish
Title of host publicationTrace Metals
Subtitle of host publicationEvolution, Environmental and Ecological Significance
PublisherNova Science Publishers, Inc.
Number of pages20
ISBN (Electronic)9781536124101
ISBN (Print)9781536124033
StatePublished - 1 Jan 2017


  • Micrometer-scale analysis
  • New York-New Jersey Harbor
  • Particle size
  • Synchrotron computed microtomography
  • Toxic metals


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