High resolution X-ray fluorescence micro-tomography on single sediment particles

L. Vincze, B. Vekemans, I. Szalóki, K. Janssens, R. Van Grieken, Huan Feng, K. W. Jones, F. Adams

Research output: Contribution to journalArticleResearchpeer-review

16 Citations (Scopus)

Abstract

This work focuses on the investigation of the distribution of contaminants in individual sediment particles from the New York/New Jersey Harbor. Knowledge of the spatial distribution of the contaminants within the particles is needed to enable (1) more sophisticated approaches to the understanding of the fate and transport of the contaminants in the environment and (2) more refined methods for cleaning the sediments. The size of the investigated particles ranges from 30-80 microns. Due to the low concentration of the elements of interest and the microscopic size of the environmental particles in these measurements, the small size and high intensity of the analyzing X-ray beam was critical. The high photon flux at the ESRF Microfocus beam line (ID13) was used as the basis for fluorescence tomography to investigate whether the inorganic compounds are taken upon the surface organic coating or whether they are distributed through the volume of the grains being analyzed. The experiments were done using a 13 keV monochromatic beam of approximately 2 μm in size having an intensity of 1010 ph/s, allowing absolute detection limits on the 0.04-1 fg level for Ti, Cr, Mn, Fe, Ni, and Zn.

Original languageEnglish
Pages (from-to)240-248
Number of pages9
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume4503
DOIs
StatePublished - 1 Jan 2001

Fingerprint

Microtomography
Sediment
Fluorescence
Tomography
Sediments
sediments
High Resolution
tomography
Impurities
contaminants
X rays
fluorescence
high resolution
Inorganic compounds
Organic coatings
x rays
Ports and harbors
inorganic compounds
Spatial distribution
Detection Limit

Cite this

Vincze, L. ; Vekemans, B. ; Szalóki, I. ; Janssens, K. ; Van Grieken, R. ; Feng, Huan ; Jones, K. W. ; Adams, F. / High resolution X-ray fluorescence micro-tomography on single sediment particles. In: Proceedings of SPIE - The International Society for Optical Engineering. 2001 ; Vol. 4503. pp. 240-248.
@article{9b1bd7f5c8ec419eba2d8dd14b3729dc,
title = "High resolution X-ray fluorescence micro-tomography on single sediment particles",
abstract = "This work focuses on the investigation of the distribution of contaminants in individual sediment particles from the New York/New Jersey Harbor. Knowledge of the spatial distribution of the contaminants within the particles is needed to enable (1) more sophisticated approaches to the understanding of the fate and transport of the contaminants in the environment and (2) more refined methods for cleaning the sediments. The size of the investigated particles ranges from 30-80 microns. Due to the low concentration of the elements of interest and the microscopic size of the environmental particles in these measurements, the small size and high intensity of the analyzing X-ray beam was critical. The high photon flux at the ESRF Microfocus beam line (ID13) was used as the basis for fluorescence tomography to investigate whether the inorganic compounds are taken upon the surface organic coating or whether they are distributed through the volume of the grains being analyzed. The experiments were done using a 13 keV monochromatic beam of approximately 2 μm in size having an intensity of 1010 ph/s, allowing absolute detection limits on the 0.04-1 fg level for Ti, Cr, Mn, Fe, Ni, and Zn.",
author = "L. Vincze and B. Vekemans and I. Szal{\'o}ki and K. Janssens and {Van Grieken}, R. and Huan Feng and Jones, {K. W.} and F. Adams",
year = "2001",
month = "1",
day = "1",
doi = "10.1117/12.452865",
language = "English",
volume = "4503",
pages = "240--248",
journal = "Proceedings of SPIE - The International Society for Optical Engineering",
issn = "0277-786X",
publisher = "SPIE",

}

High resolution X-ray fluorescence micro-tomography on single sediment particles. / Vincze, L.; Vekemans, B.; Szalóki, I.; Janssens, K.; Van Grieken, R.; Feng, Huan; Jones, K. W.; Adams, F.

In: Proceedings of SPIE - The International Society for Optical Engineering, Vol. 4503, 01.01.2001, p. 240-248.

Research output: Contribution to journalArticleResearchpeer-review

TY - JOUR

T1 - High resolution X-ray fluorescence micro-tomography on single sediment particles

AU - Vincze, L.

AU - Vekemans, B.

AU - Szalóki, I.

AU - Janssens, K.

AU - Van Grieken, R.

AU - Feng, Huan

AU - Jones, K. W.

AU - Adams, F.

PY - 2001/1/1

Y1 - 2001/1/1

N2 - This work focuses on the investigation of the distribution of contaminants in individual sediment particles from the New York/New Jersey Harbor. Knowledge of the spatial distribution of the contaminants within the particles is needed to enable (1) more sophisticated approaches to the understanding of the fate and transport of the contaminants in the environment and (2) more refined methods for cleaning the sediments. The size of the investigated particles ranges from 30-80 microns. Due to the low concentration of the elements of interest and the microscopic size of the environmental particles in these measurements, the small size and high intensity of the analyzing X-ray beam was critical. The high photon flux at the ESRF Microfocus beam line (ID13) was used as the basis for fluorescence tomography to investigate whether the inorganic compounds are taken upon the surface organic coating or whether they are distributed through the volume of the grains being analyzed. The experiments were done using a 13 keV monochromatic beam of approximately 2 μm in size having an intensity of 1010 ph/s, allowing absolute detection limits on the 0.04-1 fg level for Ti, Cr, Mn, Fe, Ni, and Zn.

AB - This work focuses on the investigation of the distribution of contaminants in individual sediment particles from the New York/New Jersey Harbor. Knowledge of the spatial distribution of the contaminants within the particles is needed to enable (1) more sophisticated approaches to the understanding of the fate and transport of the contaminants in the environment and (2) more refined methods for cleaning the sediments. The size of the investigated particles ranges from 30-80 microns. Due to the low concentration of the elements of interest and the microscopic size of the environmental particles in these measurements, the small size and high intensity of the analyzing X-ray beam was critical. The high photon flux at the ESRF Microfocus beam line (ID13) was used as the basis for fluorescence tomography to investigate whether the inorganic compounds are taken upon the surface organic coating or whether they are distributed through the volume of the grains being analyzed. The experiments were done using a 13 keV monochromatic beam of approximately 2 μm in size having an intensity of 1010 ph/s, allowing absolute detection limits on the 0.04-1 fg level for Ti, Cr, Mn, Fe, Ni, and Zn.

UR - http://www.scopus.com/inward/record.url?scp=0035764546&partnerID=8YFLogxK

U2 - 10.1117/12.452865

DO - 10.1117/12.452865

M3 - Article

VL - 4503

SP - 240

EP - 248

JO - Proceedings of SPIE - The International Society for Optical Engineering

JF - Proceedings of SPIE - The International Society for Optical Engineering

SN - 0277-786X

ER -