TY - GEN
T1 - Microanalysis of NY/NJ Harbor sediments using synchrotron X-ray beams
AU - Jones, K. W.
AU - Feng, H.
AU - Lanzirotti, A.
AU - Marinkovic, N.
AU - Neuhäusler, U.
AU - Riekel, C.
AU - Vincze, L.
AU - Vekemans, B.
AU - Szaloki, I.
AU - Song, Z.
PY - 2004
Y1 - 2004
N2 - Sediments found in the New York/New Jersey Harbor are widely contaminated with organic and inorganic compounds of anthropogenic origin. As a result, the environmental health of the Harbor has deteriorated and the efficient operation of the Port compromised by difficulties in disposing of sediments resulting from maintenance and improvements of navigational channels. Knowledge of the properties of the sediments on a micro-scale is useful in understanding the transport of contaminants through the environment, for developing effective methods for sediment decontamination, and for subsequent beneficial use of the cleaned sediments. We have investigated several properties of these sediments using synchrotron radiation techniques. These include computed microtomography using absorption and fluorescence contrast mechanisms, x-ray microscopy, microbeam x-ray fluorescence, and Fourier Transform Infrared Spectroscopy (FTIR) for measurements of microstructure, distribution of metals on individual sediment particles, and chemical forms of the contaminants on a micrometer scale. Typical results obtained with these techniques are presented.
AB - Sediments found in the New York/New Jersey Harbor are widely contaminated with organic and inorganic compounds of anthropogenic origin. As a result, the environmental health of the Harbor has deteriorated and the efficient operation of the Port compromised by difficulties in disposing of sediments resulting from maintenance and improvements of navigational channels. Knowledge of the properties of the sediments on a micro-scale is useful in understanding the transport of contaminants through the environment, for developing effective methods for sediment decontamination, and for subsequent beneficial use of the cleaned sediments. We have investigated several properties of these sediments using synchrotron radiation techniques. These include computed microtomography using absorption and fluorescence contrast mechanisms, x-ray microscopy, microbeam x-ray fluorescence, and Fourier Transform Infrared Spectroscopy (FTIR) for measurements of microstructure, distribution of metals on individual sediment particles, and chemical forms of the contaminants on a micrometer scale. Typical results obtained with these techniques are presented.
UR - http://www.scopus.com/inward/record.url?scp=23844499120&partnerID=8YFLogxK
M3 - Conference contribution
AN - SCOPUS:23844499120
SN - 1574771434
SN - 9781574771435
T3 - Remediation of Contaminated Sediments - 2003: Proceedings of the Second International Conference on Remediation of Contaminated Sediments
SP - 605
EP - 613
BT - Remediation of Contaminated Sediments - 2003
A2 - Pellei, M.
A2 - Porta, A.
T2 - Second International Conference on Remediation of Contaminated Sediments - 2003
Y2 - 30 September 2003 through 3 October 2003
ER -