Microanalysis of NY/NJ Harbor sediments using synchrotron X-ray beams

K. W. Jones, H. Feng, A. Lanzirotti, N. Marinkovic, U. Neuhäusler, C. Riekel, L. Vincze, B. Vekemans, I. Szaloki, Z. Song

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

Abstract

Sediments found in the New York/New Jersey Harbor are widely contaminated with organic and inorganic compounds of anthropogenic origin. As a result, the environmental health of the Harbor has deteriorated and the efficient operation of the Port compromised by difficulties in disposing of sediments resulting from maintenance and improvements of navigational channels. Knowledge of the properties of the sediments on a micro-scale is useful in understanding the transport of contaminants through the environment, for developing effective methods for sediment decontamination, and for subsequent beneficial use of the cleaned sediments. We have investigated several properties of these sediments using synchrotron radiation techniques. These include computed microtomography using absorption and fluorescence contrast mechanisms, x-ray microscopy, microbeam x-ray fluorescence, and Fourier Transform Infrared Spectroscopy (FTIR) for measurements of microstructure, distribution of metals on individual sediment particles, and chemical forms of the contaminants on a micrometer scale. Typical results obtained with these techniques are presented.

Original languageEnglish
Title of host publicationRemediation of Contaminated Sediments - 2003
Subtitle of host publicationProceedings of the Second International Conference on Remediation of Contaminated Sediments
EditorsM. Pellei, A. Porta
Pages605-613
Number of pages9
StatePublished - 1 Dec 2004
EventSecond International Conference on Remediation of Contaminated Sediments - 2003 - Venice, Italy
Duration: 30 Sep 20033 Oct 2003

Publication series

NameRemediation of Contaminated Sediments - 2003: Proceedings of the Second International Conference on Remediation of Contaminated Sediments

Other

OtherSecond International Conference on Remediation of Contaminated Sediments - 2003
CountryItaly
CityVenice
Period30/09/033/10/03

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    Jones, K. W., Feng, H., Lanzirotti, A., Marinkovic, N., Neuhäusler, U., Riekel, C., Vincze, L., Vekemans, B., Szaloki, I., & Song, Z. (2004). Microanalysis of NY/NJ Harbor sediments using synchrotron X-ray beams. In M. Pellei, & A. Porta (Eds.), Remediation of Contaminated Sediments - 2003: Proceedings of the Second International Conference on Remediation of Contaminated Sediments (pp. 605-613). (Remediation of Contaminated Sediments - 2003: Proceedings of the Second International Conference on Remediation of Contaminated Sediments).