Study of the microgeometry of porous materials using synchrotron computed microtomography

K. W. Jones, Huan Feng, W. B. Lindquist, P. M. Adler, J. F. Thovert, B. Vekemans, L. Vincze, I. Szaloki, R. Van Grieken, F. Adams, C. Riekel

Research output: Contribution to journalArticle

8 Citations (Scopus)

Abstract

A series of measurements of measurements of the structure of a variety of porous materials has been made using synchrotron computed microtomography (SCMT). The work was carried out at the Brookhaven National Synchrotron Light Source (NSLS), the Argonne Advanced Photon Source (APS) and the European Synchrotron Radiation Facility (ESRF). The experiments at Brookhaven and Argonne were carried out on bending magnet beam lines using area detectors to obtain CT images based on determination of X-ray absorption coefficients. The work at the ESRF used an undulator beam line, a 13 KeV pencil X-ray beam of 2 μm and an energy dispersive X-ray detector to make tomographic sections of trace element distributions by X-ray flourescence tomography. Most of the work was done with a pixel/voxel size ranging from 0.002 to 0.010 mm. We examined the structure of unconsolidated estuarine sediments, whose structure is relevant to transport of contaminants in rivers and estuaries. Fluorescent tomography with 2-3 μm resolution was used to ascertain whether or not metals were concentrated on the surface or throughout the volume of a single sediment particle. Sandstone samples were investigated to obtain a set of values describing their microstructures that could be useful in fluid flow calculations relevant to petroleum recovery or transport of environmental contaminants. Measurements were also made on sandstone samples that had been subjected to high-pressure compression to investigate the relation between the microgeometry and the magnitude of the applied pressure. Finally, a Wood's metal-filled sample was scanned for demonstration of resolution enhancement and fluid flow studies.

Original languageEnglish
Pages (from-to)39-49
Number of pages11
JournalGeological Society Special Publication
Volume215
DOIs
StatePublished - 26 Sep 2003

Fingerprint

Synchrotrons
Porous materials
Sandstone
Synchrotron radiation
X rays
Tomography
Light sources
Flow of fluids
Sediments
Impurities
tomography
Detectors
fluid flow
Wigglers
X ray absorption
sandstone
Estuaries
Trace elements
Metals
Magnets

Cite this

Jones, K. W. ; Feng, Huan ; Lindquist, W. B. ; Adler, P. M. ; Thovert, J. F. ; Vekemans, B. ; Vincze, L. ; Szaloki, I. ; Van Grieken, R. ; Adams, F. ; Riekel, C. / Study of the microgeometry of porous materials using synchrotron computed microtomography. In: Geological Society Special Publication. 2003 ; Vol. 215. pp. 39-49.
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Jones, KW, Feng, H, Lindquist, WB, Adler, PM, Thovert, JF, Vekemans, B, Vincze, L, Szaloki, I, Van Grieken, R, Adams, F & Riekel, C 2003, 'Study of the microgeometry of porous materials using synchrotron computed microtomography', Geological Society Special Publication, vol. 215, pp. 39-49. https://doi.org/10.1144/GSL.SP.2003.215.01.04

Study of the microgeometry of porous materials using synchrotron computed microtomography. / Jones, K. W.; Feng, Huan; Lindquist, W. B.; Adler, P. M.; Thovert, J. F.; Vekemans, B.; Vincze, L.; Szaloki, I.; Van Grieken, R.; Adams, F.; Riekel, C.

In: Geological Society Special Publication, Vol. 215, 26.09.2003, p. 39-49.

Research output: Contribution to journalArticle

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