Abstract
Dendroanalysis, the study of the element distribution in tree rings, suffers from the large number of analyses required to characterize the radial distribution of elements in a tree stem over a reasonable time period. Micro-Synchrotron X-ray Fluorescence provides a promising approach since it is capable of interrogating stem sections corresponding to the order of 100 years of growth in a reasonable time. The Synchrotron Micro X-ray Fluorescence results presented here, representative of tree growth between 1895 and 1997, were obtained from a black spruce (Picea mariana) impact ed by air-borne metal pollutants from a metal smelter.
Original language | English |
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Pages (from-to) | 118-122 |
Number of pages | 5 |
Journal | Canadian Journal of Analytical Sciences and Spectroscopy |
Volume | 46 |
Issue number | 4 |
State | Published - 2001 |
Keywords
- Micro-synchrotron X-ray fluorescence
- Tree rings